Publication Date:
2017-11-04
Description:
Author(s): Wei Wang, Yingchao Du, Lixin Yan, Zhijun Chi, Zhen Zhang, Jianfei Hua, Wenhui Huang, Chuanxiang Tang, and Ming Li The measurement of electron bunch temporal profile is one of the key diagnostics in accelerators, especially for ultrashort bunches. The electro-optic (EO) technique enables the precise longitudinal characterization of bunch electric field in a single-shot and nondestructive way, which can simultane... [Phys. Rev. Accel. Beams 20, 112801] Published Fri Nov 03, 2017
Keywords:
Beam Control, Diagnostics, and Feedback
Electronic ISSN:
1098-4402
Topics:
Physics
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