Publication Date:
2019-07-13
Description:
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.
Keywords:
Spacecraft Design, Testing and Performance
Type:
Nuclear and Space Radiation Effects Conference; Jul 21, 2003 - Jul 25, 2003; Monterey, CA; United States
Format:
application/pdf
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