Electronic Resource
Chichester [u.a.]
:
Wiley-Blackwell
Surface and Interface Analysis
20 (1993), S. 637-644
ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Experimental results are reported that improve our understanding of processes that initiate surface roughness from a single ion bombardment event.The results are from a scanning tunnelling microscopy (STM) study of the ion bombardment of silicon at implantation energies. Also reported is an atom by atom analysis of a single sputtering event - 8 keV krypton on a cleaved crystal of PbS. In both cases a very low ion dose was used to minimize the overlap of cascades. Recent results on the bombardment of gold and graphite will also be reviewed. The results show that every impact leaves its mark on the surface, indicating that surface roughening processes can be uncleated at the atomic level.
Additional Material:
11 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740200805
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