Publication Date:
2017-02-01
Description:
A new statistical approach for modeling diffraction profiles is introduced, using Bayesian inference and a Markov chain Monte Carlo (MCMC) algorithm. This method is demonstrated by modeling the degenerate reflections during application of an electric field to two different ferroelectric materials: thin-film lead zirconate titanate (PZT) of composition PbZr0.3Ti0.7O3 and a bulk commercial PZT polycrystalline ferroelectric. The new method offers a unique uncertainty quantification of the model parameters that can be readily propagated into new calculated parameters.
Print ISSN:
0021-8898
Electronic ISSN:
1600-5767
Topics:
Geosciences
,
Physics
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