ISSN:
1573-1979
Keywords:
built-in testers
;
switched-current technique
;
mixed-signal circuits
;
current comparator
;
voltage window comparator
;
cyclic A/D converters
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract This paper presents the design and analysis of a built-in tester circuit for MOS switched-current circuits used in low-voltage/low-power mixed-signal circuits/systems. The use of the tester can reduce the test length significantly. The developed tester is comprised of a current comparator, a voltage window comparator, and a digital latch. The current comparator is required to have high-accuracy, low-power consumption, simple structure with small chip area, and moderate speed. Results show that the developed current comparator circuit is developed with a small offset current, 0.1 nA, low power consumption, 20 μW, and a layout area of 0.01 mm2, where the circuit is simulated with the MOSIS SCN 2 μm CMOS process parameters and 2 V supply voltage.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1008334802957
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