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  • 1
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 98 (1994), S. 11136-11142 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 313-317 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A digital image tracking algorithm based on Fourier-transform cross-correlation has been developed to correct for instrumental drift in scanning tunneling microscope images. A technique was developed to eliminate cumulative tracking errors associated with fractional pixel drift. This tracking algorithm was used to monitor conductance changes associated with different conformations in conjugated molecular switch molecules and to trace the diffusion of individual benzene molecules on Ag{110}. Molecular motions have been tracked for up to 25 h (400 images) of acquisition time. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have designed and constructed a low temperature, ultrahigh vacuum scanning tunneling microscope (STM), taking extreme measures to isolate the microscope from acoustic, vibrational, and electronic noise. We combined a 4 K STM with line-of-sight dosing to enable one to position the crystal surface in front of an impinging molecular beam as in scattering experiments. Due to the mechanical stability of the instrument and the minimal thermal drift associated with working at 4 K we are able to locate and to image repeatedly isolated adsorbates and atomic-scale structures, such as step edges, for extended periods days. The instrument has been designed for the topographic and spectroscopic characterization of atoms and molecules on metal and semiconductor surfaces, for the investigation of the mechanism by which the STM images adsorbates on surfaces, and for inelastic electron tunneling spectroscopy of single molecules. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 918-921 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: By modulating the scanning tunneling microscope junction bias voltage at microwave frequencies, imaging and spectroscopy of insulating surfaces have become possible. In order to explore the spectroscopic capabilities of this instrument, we have developed a tunable microwave frequency alternating current scanning tunneling microscope. We combine the reliable beetle-style sample approach with coaxial sample and tip contacts. This provides us with a stable microwave-frequency-compatible scanning tunneling microscope. This alternating current scanning tunneling microscope design is compatible with ultrahigh vacuum and low-temperature operation.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 1232-1234 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Challenged by the need to transmit a microwave frequency signal to and from the tunnel junction of a scanning tunneling microscope (STM), an STM has been designed and built that provides minimal microwave signal loss. The STM has been operated over a wide frequency range, dc to 20 GHz, without the use of a microwave resonance cavity. This design also provides a flexible feedback scheme allowing selection of the required piezoelectric gain and stability. A reliable, easy to fabricate sample approach is also described that adds to the stability of this design. The operation of this microscope by imaging a lead silicate glass surface with a bias voltage modulation frequency and detection frequency of 7.73 GHz is demonstrated.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4140-4145 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have developed a broadly tunable microwave-frequency alternating current scanning tunneling microscope which employs a cavity with no resonances in the frequency range used. This results in a low, flat background for spectroscopic measurements with this instrument. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 3211-3215 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: To expand the capabilities of the microwave frequency alternating current scanning tunneling microscope to include the ability to study isolated adsorbates and highly reactive surfaces, we have developed a low temperature, ultrahigh vacuum alternating current scanning tunneling microscope. In this alternating current scanning tunneling microscope, we employ the reliable beetle-style sample approach mechanism with a number of other components unique to a low temperature scanning tunneling microscope. These include the sample transfer, delivery, retrieval, storage, sputtering, and heating systems. This alternating current scanning tunneling microscope operates at 77 and 4 K.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 2039-2039 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 84 (1986), S. 5580-5588 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The reaction of electronically excited Na(3P) atoms with HCl has been studied in a crossed molecular beams experiment. At collision energies slightly above the endoergicity of the reaction, Na(3P) shows a dramatic enhancement of reactivity over ground state Na(3S). Detailed measurements of the laboratory angular and velocity distributions of the reactively scattered NaCl product at 5.4 kcal/mol collision energy have allowed determination of the product center-of-mass translational and angular distributions. These experimental results are compared to the DIPR model of electron transfer reactions. The broad translational energy distribution is in qualitative agreement with the DIPR model, but the angular distribution exhibits reduced intensity for scattering perpendicular to the relative velocity vector which cannot be reproduced by the DIPR model. The preferred transition state configuration, Na–Cl–H, is consistent with what would be predicted by a diffuse 3P orbital where the Na atom appears ion-like. This configuration is opposite to that given by the dominant term in the long range multipolar expansion of the neutral reactant potential.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4114-4123 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A novel scheme for the measurement and characterization of the adhesion of solid coatings on solid substrates is presented. It represents an appealing alternative to standard methods, which are not satisfactory in many respects. Our technique is based on laser-induced spallation of the coatings under test, combined with an interferometric monitoring of the spallation process which is manifested in the time dependence of the surface displacement of the coating. We induce the spallation of the coating by a shock pulse generated at the backside of the sample by the impact of a Nd:YAG laser pulse. At the coated front surface of the sample, compressive pulses are reflected as tensile pulses. The coating undergoes spallation if the effective tensile stress, which is the superposition of the stresses of the incoming and reflected waves, exceeds the adhesion strength of the coating. In order to measure adhesion strengths, one has to determine the critical tensile stress at the interface corresponding to the threshold of spallation. We present our experimental setup for the laser generation of high-amplitude acoustic waves, which induce the desired spallation of a coating under test. A fiber-optic interferometer has been developed, which features a low noise level of 1 nm and a large bandwidth of 300 MHz necessary for recording the fast transient surface displacements of the sample surface. The performance and versatility of this instrument are analyzed in theory and experiment. An interactive computer program has been developed which allows the correct reconstruction also of large surface displacements from interferometer signals that stretch over many interference fringes. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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