ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The first attempt to combine luminescence spectroscopy with scanning soft x-ray microscopy has been realized in our experiment. A new imaging luminescence spectrometer with a Schwarzschild objective was designed and built with a spectral resolution of 1.3 nm in the energy range of 1.6–6.5 eV for this purpose. Some luminescent ceramics have been investigated by using this spectrometer. A high contrast in luminescence micrographs is achieved due to the confocal arrangement of the Schwarzschild system and the microscope. The spectral and microstructural properties of these ceramics could be determined by means of luminescence microspectroscopy and spectromicroscopy. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145463
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