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  • 1
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Solid State Communications 7 (1969), S. xxiii 
    ISSN: 0038-1098
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Solid State Electronics 17 (1974), S. 655-661 
    ISSN: 0038-1101
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Solid State Electronics 17 (1974), S. 879-880+IN1 
    ISSN: 0038-1101
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Solid State Electronics 29 (1986), S. 697-701 
    ISSN: 0038-1101
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Tetrahedron Letters 10 (1969), S. 2297-2300 
    ISSN: 0040-4039
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Tetrahedron Letters 15 (1974), S. 2141-2144 
    ISSN: 0040-4039
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    European journal of nutrition 21 (1982), S. 146-169 
    ISSN: 1436-6215
    Keywords: Süßwaren ; Zucker ; Karies
    Source: Springer Online Journal Archives 1860-2000
    Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, Nutrition , Medicine
    Description / Table of Contents: Summary The dissolution of sugar in the oral cavity was determined by measuring the enhancement of saliva flow and the resulting concentration of sugar after consumption of commercially available sweets as well as some test products. It was found that the dissolving rate of sugar is not a function of the absolute concentration of sugar in the sweets alone; it is determined mainly by the texture, consistency and its typical consuming behaviour as well as by the form in which the sugar is contained in the sweets (as a melt, solution or crystalline).
    Notes: Zusammenfassung Zur Ermittlung des Löslichwerdens von Zucker in der Mundhöhle wurden bei einer Reihe von handelsüblichen Süßwaren sowie Versuchsprodukten die oral auftretenden Zuckerkonzentrationen und der durch den Genuß stimulierte Speichelfluß ermittelt. Es konnte gezeigt werden, daß nicht vom absoluten Gehalt an Zucker in einem Produkt das Maß für das In-Lösung-Gehen allein bestimmt wird. Vielmehr kommen Textur, Konsistenz, Aggregatzustand des Zuckers (Schmelze, Lösung, kristallin) sowie den verzehrstypischen Eigenheiten einer jeden Süßware entscheidende Einflüsse auf das Lösungsverhalten zu.
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  • 8
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Zeitschrift für anorganische Chemie 439 (1978), S. 219-226 
    ISSN: 0044-2313
    Keywords: Chemistry ; Inorganic Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: I.R.-spectroscopic Investigation on Halogenomethyl-, Benzyl-, and α-Halogenobenzyl-substituted Alkoxysilanes, Phenoxysilanes, and DisiloxanesFrequencies of Si—O-characteristic vibrations and the relative basicity of oxygen have been measured for Si—O compounds of the type X(CH3)2Si—OY (X = halogenomethyl, benzyl, α-halogenobenzyl; Y = alkyl, phenyl, Si(CH3)2X).With exception of the less Si—O-characteristic C—O—(Si)-stretching vibration of alkoxysilanes the observed data show a significant dependence from the inductive effect of substituents at Si. There are no informations on conjugative interactions between Si and β-standing halogeno or phenyl groups.
    Notes: Es wurden die Bandenlage Si—O-charakteristischer Schwingungen sowie die relative Basizität des Sauerstoffs in Si—O-Verbindungen des Typs X(CH3)2Si—OY(X = Halogenmethyl, Benzyl, α-Halogenbenzyl; Y = Alkyl, Phenyl, Si(CH3)2X) gemessen.Mit Ausnahme der nur bedingt Si—O-charakteristischen C—O—(Si)-Valenzschwingung der Alkoxysilane zeigen die gemessenen Daten eine deutliche Abhängigkeit vom induktiven Effekt der Substituenten am Si. Es ergeben sich keine Hinweise auf konjugative Wechselwirkungen zwischen Si und den β-ständigen Halogen-bzw. Phenyl-Gruppen.
    Additional Material: 2 Ill.
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  • 9
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Zeitschrift für anorganische Chemie 445 (1978), S. 219-226 
    ISSN: 0044-2313
    Keywords: Chemistry ; Inorganic Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Silanols. XIV. I. R. Spectroscopic Investigation on Halogenomethyl-, Benzyl-, and α-Halogenobenzyl-dimethylsilanolsPosition of vOH band and the shift Δ\documentclass{article}\pagestyle{empty}\begin{document}$ \tilde \nu $\end{document} of this band at association with diethylether have been measured for silanols of the type X(CH3)2SiOH with X = CH3, CH2Cl, CH2Br, CH2J, CHCl2, CH2C6H5, CHClC6H5, CHBrC6H5.For both \documentclass{article}\pagestyle{empty}\begin{document}$ \tilde \nu $\end{document}OH and Δ\documentclass{article}\pagestyle{empty}\begin{document}$ \tilde \nu $\end{document} and linear correlations with σ* constants of substituents X have been found. These correlations are compared with results of analog investigations on triarylsilanols [2]. From band shapes result informations on weak intramolecular H-bonding between OH group and halogeno resp. phenyl substituents.
    Notes: Es wurden die Lage der vOH-Bande sowie deren Verschiebung Δ\documentclass{article}\pagestyle{empty}\begin{document}$ \tilde \nu $\end{document} bei Assoziation mit Diäthyläther für Silanole des Typs X(CH3)2SiOH mit X = CH3, CH2Cl, CH2Br, CH2J, CHCl2, CH2C6H5, CHClC6H5, CHBrC6H5 gemessen.Sowohl für die \documentclass{article}\pagestyle{empty}\begin{document}$ \tilde \nu $\end{document}OH als auch für die Δ\documentclass{article}\pagestyle{empty}\begin{document}$ \tilde \nu $\end{document} ergeben sich lineare Korrelationen mit den σ*-Konstanten der Substituenten X. Diese Korrelationen werden mit Ergebnissen analoger Untersuchungen an Triarylsilanolen [2] verglichen. Aus der Form der OH-Banden ergeben sich Hinweise auf schwache intramolekulare H-Brückenbindungen zwischen der OH-Gruppe und den Halogen- bzw. Phenyl-Substituenten.
    Additional Material: 3 Ill.
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  • 10
    Electronic Resource
    Electronic Resource
    Weinheim : Wiley-Blackwell
    Zeitschrift für anorganische Chemie 476 (1981), S. 55-61 
    ISSN: 0044-2313
    Keywords: Chemistry ; Inorganic Chemistry
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Comparative Investigations on Silyloxy and Disilanyloxy CompoundsThe frequencies of Si—O—Y characteristic IR bands and relative basicities or acidities of Me3SiOY and Me5Si2OY have been compared with analog data of compounds of the common type XMe2SiOY (X = halogenomethyl, benzyl, α-halogenobenzyl; Y = H, alkyl, phenyl, SiMe2X).There are good linear correlations between these data and Taft σ*-constants with exception of the values for disilanyl-compounds (X = Me3Si). These deviations are explained by a specific acceptor of the Si—Si bond.
    Notes: Die Lage Si—O—Y-charakteristischer IR-Banden sowie die relative Basizität bzw. Acidität von Me3SiOY und Me5Si2OY wurden mit entsprechenden Daten von Verbindungen des allgemeinen Typs XMe2SiOX verglichen (X = Halogenmethyl, Benzyl, α-Halogenbenzyl; Y = H, Alkyl, Phenyl, SiMe2X).Die Meßdaten zeigen gute lineare Beziehungen zu den Taftschen σ*-Konstanten, mit Ausnahme der Werte für die Disilanyl-Verbindungen (X = Me3Si). Diese Abweichungen werden durch einen spezifischen Acceptorcharakter der Si—Si-Bindung erklärt.
    Additional Material: 4 Ill.
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