ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Quantitative photon tunneling and shear-force microscopy of planar waveguide splitters and mixers (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 3307-3314 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A combined photon scanning tunneling and shear-force microscope has been developed to investigate the optical field distribution in a planar waveguide splitter and a multibranch mode mixer. The optical intensity distribution just above the surface of a planar waveguide is mapped with subwavelength resolution by a tapered optical fiber that probes the evanescent field. Simultaneously, the topography of the waveguide is recorded with subnanometer accuracy using a constant-distance feedback system based on shear-force detection with a tuning fork sensor. The experimental field patterns are quantitatively compared with field patterns simulated with the two-dimensional finite difference beam propagation method and a−mode solver. Good quantitative agreement between experiment and simulation is obtained. Moreover, the experiment reveals several details in the field distribution that results from incoupling conditions, mask imperfections, waveguide edges, and surface roughness. The surface effects in the optical field distribution are introduced by the use of the constant-distance feedback system. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1347952
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Photon scanning tunneling microscope in combination with a force microscope (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 1254-1257 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The simultaneous operation of a photon scanning tunneling microscope with an atomic force microscope is presented. The use of standard atomic force silicon nitride cantilevers as near-field optical probes offers the possibility to combine the two methods. Vertical forces and torsion are detected simultaneously with the optical near field, which allows a comparison between topography and the optical signal. Images of an optical thin film (indium tin oxide) and a Langmuir–Blodgett layer (pentacosa diynoic acid) show absorption contrast with a lateral resolution of about 30 nm (based on edge steepness), which is well below the diffraction limit.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356428
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Near-field optical microscope using a silicon-nitride probe (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 461-463 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Operation of an alternative near-field optical microscope is presented. The microscope uses a microfabricated silicon-nitride probe with integrated cantilever, as originally developed for force microscopy. The cantilever allows routine close contact near-field imaging on arbitrary surfaces without tip destruction. The effect of adhesion forces on the coupling to the evanescent wave has been observed. Images with a lateral resolution of about 50 nm are presented and compared with atomic force images. A specific sample area can be selected using an integrated conventional light microscope.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.108933
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Novel calixarenes in thin films for efficient second harmonic generation (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 2015-2017 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Calix[4]arenes are a novel type of molecules for nonlinear optics. In a single molecule four π-conjugated systems are combined. Corona poled guest-host polymer systems [calix[4]arenes-poly(methyl-methacrylate)] with transparency into the UV and loading up to 100% show a high degree of orientation. The maximum resonant d33 nonlinear coefficient measured at a fundamental wavelength of 590 nm is 51 pm/V. The d33 values of the thin films relax after poling to 65% of their maximum value. Results indicate self-organization of the molecules upon poling.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.109520
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    High definition aperture probes for near-field optical microscopy fabricated by focused ion beam milling (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 3115-3117 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have improved the optical characteristics of aluminum-coated fiber probes used in near-field scanning optical microscopy by milling with a focused ion beam. This treatment produces a flat-end face free of aluminum grains, containing a well-defined circularly-symmetric aperture with controllable diameter down to 20 nm. The polarization behavior of the tips is circularly symmetric with a polarization ratio exceeding 1:100. The improved imaging characteristics are demonstrated by measuring single molecule fluorescence. Count rates increase more than one order of magnitude over unmodified probes, and the molecule images map a spatial electric field distribution of the aperture in agreement with calculations. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121564
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 6
    Electronic Resource
    Electronic Resource
    Dynamic behavior of tuning fork shear-force feedback (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 71 (1997), S. 28-30 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The dynamics of a tuning fork shear-force feedback system, used in a near-field scanning optical microscope, have been investigated. Experiments, measuring amplitude and phase of the tuning fork oscillation as a function of driving frequency and tip-sample distance, reveal that the resonance frequency of the tuning fork changes upon approaching the sample. Either amplitude or phase of the tuning fork can be used as distance control parameter in the feedback system. Using amplitude a second-order behavior is observed while with phase only a first-order behavior is observed, and confirmed by numerical calculations. This first-order behavior results in an improved stability of our feedback system. A sample consisting of DNA strands on mica was imaged which showed a height of the DNA of 1.4 nm. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.119482
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 7
    Electronic Resource
    Electronic Resource
    Study of the leakage field of magnetic force microscopy thin-film tips using electron holography (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 1865-1867 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electron holography is applied for the study of the leakage field of thin-film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed along the pyramid axis. Good agreement between simulated and experimental electron phase difference maps allows to measure the local flux from the ferromagnetic tips and therefore to evaluate the perturbation induced by the microprobe stray field on the sample area. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.116039
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 8
    Electronic Resource
    Electronic Resource
    Atomic steps with tuning-fork-based noncontact atomic force microscopy (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 75 (1999), S. 1640-1642 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Tuning forks as tip–sample distance detectors are a promising and versatile alternative to conventional cantilevers with optical beam deflection in noncontact atomic force microscopy (AFM). Both theory and experiments are presented to make a comparison between conventional and tuning-fork-based AFM. Measurements made on a Si(111) sample show that both techniques are capable of detecting monatomic steps. The measured step height of 0.33 nm is in agreement with the accepted value of 0.314 nm. According to a simple model, interaction forces of 30 pN are obtained for the tuning-fork-based setup, indicating that, at the proper experimental conditions, the sensitivity of such an instrument is competitive to conventional lever-based AFM. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.124780
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 9
    Electronic Resource
    Electronic Resource
    Photon scanning tunneling microscopy of tailor-made photonic structures (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 142-144 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Optical field distributions around individually fabricated subwavelength scatterers mapped with a photon scanning tunneling microscope are presented. The photonic structures are produced from ridge waveguides using focused-ion-beam milling. This flexible technique allows us to make single holes and slits of sizes down to 30 nm. A quantitative analysis of the observed optical pattern due to interference between incoming and reflected light yields insight about subwavelength scatterers in waveguides. We conclude that light scattering into high-loss modes of the waveguide occurs. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.126903
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 10
    Electronic Resource
    Electronic Resource
    Visualization of mode transformation in a planar waveguide splitter by near-field optical phase imaging (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 910-912 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The gradual transformation of a guided TM00 mode into an "intermediate" double mode by a splitting junction has been investigated with a phase-sensitive photon scanning tunneling microscope. Field profiles and wave vectors of the modes have been directly determined from the phase information. Via a Fourier analysis of the measured phase and amplitude maps the decay of the TM00 mode and buildup of the intermediate mode have been directly visualized. Phase singularities and phase jumps in the transition region underline the mode transformation process. Finally, a partial polarization conversion of the TM modes to TE-polarized modes has been observed. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1394175
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...