Publication Date:
2011-06-29
Description:
Author(s): V. M. Kaganer, M. Wölz, O. Brandt, L. Geelhaar, and H. Riechert X-ray diffraction peaks from nanowires with quantum disks inserted to form axial heterostructures are studied theoretically and experimentally. The peak profiles are calculated taking into account partial coherence of the x-ray beam, the orientational distribution of nanowires, their length distribu... [Phys. Rev. B 83, 245321] Published Tue Jun 28, 2011
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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