Publication Date:
2018-06-08
Description:
High T_c edge-geometry SNS microbridges have been fabricated using ion-damaged YBa_2Cu_3O_(7-x) (YBCO) and a nonsuperconducting phase of YBCO (N-YBCO) as normal metals. Optimization of the ion milling process used for YBCO edge formation and cleaning has resulted in ion-damage barrier devices which exhibit I-V characteristics consistent with the Resistively-Shunted-Junction (RSJ) model, with typical current densities (J_c) of approximately 5 x 10^6 A/cm^2 at 4.2 K. Characterization of N-YBCO films suggests that N-YBCO is the orthorhombic YBCO phase with oxygen disorder suppressing T_c...
Type:
Electrochemical Society: Second Symposium of Low Temperature Electronics and High Temperature Superconducting; Honolulu, HI; United States|Proceedings of the Electrochemical Society: Second Symposium of Low Temperature Electronics and High Temperature Superconducting
Format:
text
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