ISSN:
1608-3415
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract A tabular analytic method for calculating space surface parameters of different materials is suggested. It uses Fourier transforms obtained with an atomic force microscope. Examples of calculation are given for periodic space structures and surfaces with different degrees of anisotropy and periodicity. It is shown that space parameters, namely, texture direction and texture direction index and also radial wavelength and radial wavelength index, allow anisotropy characterization and periodicity determination at a nanometer scale.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1026644220113
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