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  • 1
    Electronic Resource
    Electronic Resource
    Transition from a single-domain to a multidomain state in mesoscopic ferromagnetic Co structures (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 531-534 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have performed magnetic force microscopy measurements on isolated 35 nm thick rectangular Co structures. The structures have a length L ranging between 0.25 and 10 μm and a width W ranging between 0.25 and 5.5 μm, covering aspect ratios m=L/W between 1 and 40. This enables us to map the transition from a magnetic single-domain state towards a magnetic multidomain state when increasing the size of the structures. This transition depends on the size as well as the aspect ratio of the structures. Our results can be interpreted in terms of the theoretical model developed by A. Aharoni [J. Appl. Phys. 63, 5879 (1988)]. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1324687
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  • 2
    Electronic Resource
    Electronic Resource
    Structural characterization of periodic arrays of magnetic dots (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 4216-4222 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the structure and regularity of macroscopically large arrays of submicron magnetic Au/Co/Au dots, which were prepared by combining electron beam lithography, molecular beam epitaxy, and lift-off techniques. Atomic force microscopy was used to characterize the surface roughness of the dots and to show the reproducibility of dot size and periodicity over large areas; low-angle x-ray diffuse scattering experiments were employed to construct a mapping of the reciprocal space in the vicinity of the (000) reflection of the dots. The reciprocal space mapping thus provides information about the internal structure of the dots, as well as about the lateral periodicity of the dot array. This work underlines the important complementarity of scanning probe and x-ray diffraction techniques for the detailed characterization of patterned structures. We observed that the x-ray diffraction patterns are extremely sensitive to the orientation of the dot lattice with respect to the incoming x-ray beam, allowing a quantitative analysis of the lateral periodicity of the dot array and the size of the individual dots. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.373055
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  • 3
    Electronic Resource
    Electronic Resource
    Structural characterization of ion-beam synthesized NiSi2 layers (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 1707-1712 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: NiSi2(111) and NiSi2(100) layers with good crystalline quality have been formed by ion-beam synthesis. An unusual Ni atom distribution showing two completely separated layers during a single implantation step has been observed by Rutherford backscattering spectrometry (RBS) and transmission electron microscopy (TEM). The orientation, strain, and stiffness of the NiSi2 layers have been studied by RBS/channeling, x-ray diffraction, and TEM. The results show that the continuous NiSi2 layers have type-A orientation with a parallel elastic strain larger than the theoretical value of 0.46% for pseudomorphic growth. The perpendicular strain of the NiSi2(111) layers is apparently smaller than that of NiSi2(100) layers, indicating a higher stiffness in the 〈111〉 direction. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360268
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  • 4
    Electronic Resource
    Electronic Resource
    Growth and properties of ion beam synthesized Si/CoxNi1−xSi2/Si(111) structures (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 1201-1203 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Heteroepitaxial CoxNi1−xSi2 layers with good crystalline quality (χmin=3.5%) have been formed by ion beam synthesis. For a sample with x=0.66, we found that this ternary silicide layer contains 11% type B and 89% type A orientation. The transmission electron microscopy investigation reveals that the type B component is mainly located at the interfaces and with a thickness of only a few monolayers. X-ray diffraction studies of the sample show that the strain of the type B component is smaller than that of the type A and is probably the reason for such a unique distribution of the type B component in the epilayer. Rutherford backscattering-channeling, Auger electron spectroscopy, transmission electron microscopy, and x-ray diffraction have been used in this study.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.356476
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  • 5
    Electronic Resource
    Electronic Resource
    Observation of the Abrikosov vortex lattice in NbSe2 with magnetic force microscopy (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 1134-1136 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have imaged the Abrikosov vortex lattice on the surface of a conventional superconductor with a low-temperature magnetic force microscope, which is based on commercially available piezoresistive cantilevers. The heat dissipation at low temperature is limited by operating the cantilevers at higher mechanical resonances, allowing one to improve the signal-to-noise ratio by a factor of 3. Using a Co/Au multilayer for the magnetic tip coating, the interaction with the vortices can be kept small, and it is possible to observe a stable vortex lattice on the surface of a cleaved NbSe2 crystal. The stability of the vortex lattice can be understood in terms of collective pinning effects. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122107
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  • 6
    Electronic Resource
    Electronic Resource
    Low temperature magnetic force microscopy with enhanced sensitivity based on piezoresistive detection (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 4468-4473 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe the design and performance of a low temperature magnetic force microscope (MFM) based on commercially available piezoresistive cantilevers. The sensitivity has been increased by exciting the cantilever at a higher (second or third) flexural mode. The operation at higher mechanical resonances allows to improve the signal-to-noise ratio by a factor of 3. Our MFM is particularly advantageous for studying magnetic vortices on the surface of superconductors. The magnetic tip coating was optimized by relying on Co/Au multilayers grown by molecular beam epitaxy. This allows one to keep the interaction with the vortices small, and it becomes possible to observe a stable vortex lattice on the surface of a cleaved NbSe2 crystal. From our measurements of the disordered vortex state in thin Nb films we infer that the magnetic stray field induced by the tip is in the range 0.3–0.5 mT. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1322582
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  • 7
    Electronic Resource
    Electronic Resource
    Roughness in Nb/Cu multilayers determined by x-ray diffraction and atomic force microscopy (1995)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 3429-3431 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nb/Cu multilayers grown by molecular beam epitaxy have been studied by x-ray diffraction and atomic force microscopy. X-ray diffraction provides the average interface roughness while atomic force microscopy shows the roughness and topology of the upper surface. Comparison of both methods shows that high-angle diffraction averages over a lateral length which is in good agreement with the typical grain size. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.115269
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  • 8
    Electronic Resource
    Electronic Resource
    Large positive magnetoresistance in Cr/Ag/Cr trilayers (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 70 (1997), S. 1477-1479 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Large positive magnetoresistance (LPMR) effects have been measured at temperatures T〈100 K in epitaxial Cr/Ag/Cr trilayers grown by molecular beam epitaxy. Compared to single Ag films, the magnetoresistance at 4.2 K is enhanced by nearly two orders of magnitude reaching values up to 120% in a field of 8 Tesla. This behavior is related to a drastic modification of the electron scattering at the Ag interfaces due to the presence of the buffer and cap Cr layers. The LPMR curves measured at different temperatures demonstrate a scaling behavior typical for electron transport in two-dimensional systems. The magnitude of the LPMR is a function of temperature and residual resistance ratio and is influenced by the direction of the applied magnetic field. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.118567
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  • 9
    Electronic Resource
    Electronic Resource
    Application of off-specular polarized neutron reflectometry to measurements on an array of mesoscopic ferromagnetic disks (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 991-993 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using off-specular polarized neutron reflectometry with neutron spin analysis, we determined the magnetic properties of a large array of in-plane magnetized ferromagnetic Co disks. Resonant peaks are clearly observed in the off-specular reflectivity, due to the lateral periodicity of the disk array. Using polarized neutrons, the intensity of the resonant peak in the off-specular reflectivity is studied as a function of the magnetic field applied in the sample plane. Spin analysis of the reflected neutrons reveals the magnetization reversal and saturation within the disks. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1389764
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  • 10
    Electronic Resource
    Electronic Resource
    Low-angle X-ray diffraction of multilayered structures (1991)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 24 (1991), S. 571-575 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Low-angle X-ray diffraction profiles can provide detailed information about the multilayer periodicity and thickness of the individual layers that make up a multilayer. The effect of discrete and continuous random cumulative fluctuations of the layer thicknesses on the diffraction profiles of single films, bilayers and multilayers is discussed. It is shown that the calculated low-angle profiles of single films can distinguish between discrete and continuous thickness errors. In bilayers and multilayers, however, no difference between these thickness errors can be seen and only an overall thickness error may be extracted.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889891004156
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