ISSN:
1573-0727
Keywords:
simulation
;
yield
;
SMT
;
MCM
;
board
;
test
;
DFT
;
DFM
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract Simulation techniques used in the Manufacturing Test SIMulator(MTSIM) are described. MTSIM is a Concurrent Engineering tool used tosimulate the manufacturing test andrepair aspects of boards and MCMs from design concept through manufacturing release. MTSIM helps designers select assemblyprocess, specify Design For Test (DFT) features, select board testcoverage, specify ASIC defect level goals, establish productfeasibility, and predict manufacturing quality and cost goals. A newyield model for boards and MCMs which accounts for theclustering of solder defects is introduced and used topredict the yield at each test step. In addition, MTSIMestimates the average number of defects per board detected at eachtest step, and estimates costs incurred in test execution, faultisolation and repair. MTSIM models were validated withhigh performance assemblies at Hewlett-Packard (HP).
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1008286901817
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