ISSN:
1662-9752
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
An X-ray microtomography combined with hard X-ray imaging microscopy, thatpotentially has a spatial resolution of the order of 10 to 100 nm, has been applied to thethree-dimensional observation of internal microstructural features in overaged Al-Ag alloys. AFresnel zone plate is used as an objective with a magnification of 49.3 times. Imaging of resolutiontest patterns has indicated spatial resolutions of around 180 and 200 nm in the vertical and horizontaldirections, respectively. This paper reports the first impression of the microstructural imaging bymeans of such a high-resolution imaging microtomography. Precipitate microstructures are readilyobserved and quantified in terms of volume fraction and orientation. Conventional microtomographywith a simple projection geometry is also applied for comparison purpose at the highest resolutionlevel currently available at a third generation synchrotron facility. It would appear that the presenttechnique provides a unique potential to observe the 3-D geometry and spatial distribution ofnanoscopic features inside samples that are several orders of magnitude thicker than thin-foilspecimens for TEM observation
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/13/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.519-521.1361.pdf
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