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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 3319-3325 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: As an acceptor dopant with a solid:liquid distribution coefficient ks〈1, iron is an example of an impurity which can be used in modest amounts to ensure that an adequate fraction of EL2 midgap defects are ionized along the length of a melt-grown GaAs crystal, as desired for semi-insulating behavior. The results of such deliberate doping with iron (when NFe is in the mid-1015 cm−3 range) are reported for crystals grown by both the liquid encapsulated Czochralski and the vertical gradient freeze methods. Except in the very tail region of such crystals (when NFe(approximately-greater-than)NEL2 and high resistivity p-type behavior results), GaAs with this modest iron modification to the compensation balance behaves with quite ordinary semi-insulating properties. The iron acceptors are then all ionized, and are optically "invisible.''
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 7416-7421 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Optical and electrical properties are described for bulk GaAs, grown from a melt doped with iron to create FeGa deep acceptors in a sufficient amount (exceeding the EL2 defect concentration) to make high-resistivity p-type rather than semi-insulating material. Both iron photoionization and EL2+ photoneutralization contribute to the near-infrared optical absorption. This made it possible to deduce the concentrations (NAi and NAn) of ionized and lattice-neutral iron, and the ratio (NAi/NAn). Temperature dependent measurements of dc electrical transport yielded quantities such as the free hole density, and hence the Fermi energy, for the 290–420 K range. This information combined with (NAi/NAn) led to a determination of the iron acceptor's free energy εA(T): about 0.46 eV above the valence band at 300 K, and ∼40 meV closer at 420 K. The temperature dependence of εA for iron is shown to differ from εv, εc, midgap, or the free energy for CrGa acceptors in GaAs.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Geophysical prospecting 32 (1984), S. 0 
    ISSN: 1365-2478
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Geosciences , Physics
    Notes: Classical methods of interpretation of reflection seismic data are such that interpretation and processing usually occur in the “collected” frame of reference. However, in recent times other data planes have gained increasing acceptance in seismology as a viable alternative. Through linear transformations applied to a record section, both the t—p- and p—x-planes can be produced. The r—p-domain may be obtained from the t—x-plane by a transformation known as slant stacking. Normal practice has been to do most of the data processing in the t—x-plane and then transforming to the r—p-plane. However, many of the procedures used in the t—x-domain can be modified for use in the t—p-plane to increase the coherence.Velocity inversion may be carried out either in the r—p-domain or further transformed to the p—x-plane where the modified Herglotz-Wiechert inversion may be applied. To perform the inversion, the t—p-wavefield is converted to a p—x-representation by the use of a new linear transformation technique, the cross-stack. By a simple sampling process along a particular p—x-trajectory, the Herglotz-Wiechert method can be used to reconstruct an acceptable velocity model of the subsurface. A comparison of derived velocity structures is made between that produced by the Herglotz-Wiechert technique and that of the Dix method.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2106-2108 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Both optical and electrical methods were used to provide separate evaluations of the fraction Pi of EL2 defect donors which have lost an electron. The semi-insulating GaAs which permitted these assessments had a large enough fraction of the EL2 compensated (by CAs acceptors) to make this a sensitive test. Room-temperature Hall effect data, analyzed with an ambipolar correction, indicated that Pi (approximately-equal-to)0.34 in material from a vertical-zone grown crystal, while near-infrared optical absorption could be modeled on a superposition of EL2 photoionization and photoneutralization to yield Pi (approximately-equal-to)0.35 in the same crystal. The presence of compensating CAs acceptors was verified by local mode vibrational absorption.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Journal of the American Chemical Society 95 (1973), S. 7114-7123 
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 256-261 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Attainment of semi-insulating status when an "undoped'' GaAs crystal is grown from the melt requires a delicate balance among concentrations of "unintentional'' donor and acceptor impurities, and defects, notably the EL2 midgap donor. In qualifying and improving material for device uses, defect identification and characterization is important. The compensation balance is analyzed in this paper for various "undoped'' crystals, relying largely on Hall data over the 290–430 K range, coupled with optical absorption measurements of carbon and EL2. The temperature-dependent data, converted into Fermi energy and into EL2 ionized fraction, provide a clearer picture than just room-temperature measurements as to whether EL2 controls the Fermi energy (giving the desired semi-insulating behavior), or whether a shallower defect species is in control.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 852-858 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electrical and optical measurements are reported for samples from two undoped semi-insulating GaAs crystals grown by a vertical molten zone method. The electrical data, taken over the range 290–420 K, included results for samples from both crystals that were so close to intrinsic as to require an ambipolar correction in determining the electron concentration. The compensation balance in this material is controlled by the EL2 midgap defect, of which the fraction ionized depends on trace presence of CAs shallow acceptors, and of shallow donors, probably including SiGa . An increase of the latter towards the tail (top) end of one crystal led to a reduction of the EL2 ionized fraction, and a lowered resistivity—but one still within the conventional semi-insulating range. Carbon was measured from the strength of its local vibrational mode absorption, while near-infrared measurements showed that EL2 was present in a concentration ∼1016 cm−3, with relatively small variation across a wafer.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 5428-5434 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A simple procedure is described for numerical correction of conductivity and Hall-effect data in a (GaAs) sample which is near intrinsic or slightly on the n side of intrinsic, such that hole conduction affects the conductivity and Hall coefficient to a modest extent. The numerical procedure is based on the ratio of the measured Hall coefficient to that expected for intrinsic GaAs at the same temperature. One can thereby deduce the electron concentration n0 and the electron mobility, simply, but with reasonable accuracy. The method can be used for any temperature at which transport measurement are normally made with semi-insulating GaAs, and its use is demonstrated with data for three high-resistivity "undoped'' samples from crystals grown by a vertical Bridgman method.
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  • 9
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 698 (1993), S. 0 
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 10
    ISSN: 0022-0248
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
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