Publication Date:
2011-05-26
Description:
Author(s): T. König, L. Heinke, G. H. Simon, and M. Heyde The measurand in dynamic force microscopy is the frequency shift, which is a direct function of the tip-sample interaction. In this work, this interaction is experimentally investigated in the parameter space of tip-sample distance and bias voltage. This three-dimensional database is theoretically d... [Phys. Rev. B 83, 195435] Published Wed May 25, 2011
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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