Electronic Resource
Chichester [u.a.]
:
Wiley-Blackwell
Surface and Interface Analysis
26 (1998), S. 869-871
ISSN:
0142-2421
Keywords:
SIMS
;
secondary ion mass spectrometry
;
EDX
;
ore
;
Ni, Cu
;
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
High-resolution SIMS images in conjunction with elastically backscattered electron and energy-dispersive x-ray images have been acquired from a polished slightly oxidized multiphase polycrystalline surface of Ni-Cu sulphide ore. Through correlation of data acquired by the three methods, the extent to which oxidation occurs is shown to be mineral dependent and related to the presence of macroscopic and microscopic surface heterogeneities. © 1998 John Wiley & Sons, Ltd.
Additional Material:
1 Ill.
Type of Medium:
Electronic Resource
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