Publication Date:
2017-05-09
Description:
Display glasses meet the demands of the flat panel display industry vis-à-vis their composition, flatness, and forming processes. Here we report the high-resolution time-of-flight secondary ion mass spectrometry (ToF-SIMS) characterization of Corning ® EAGLE XG ® , a widely used display glass, and subsequent chemometric analyses of these data. Samples analyzed included the as-formed glass, fracture surfaces from remelt bars, and as-formed surfaces subsequently exposed to process-relevant treatments including strong acids and bases, two industrial detergents, and an atmospheric-pressure plasma treatment. Elemental signals in the positive ion ToF-SIMS spectra respond to surface treatments. Acidic conditions leach non-silica components from the surfaces, while basic treatments extract these species less efficiently. The detergents leave residues of Na + and K + . The atmospheric pressure (AP) plasma treatment had little effect on the surface composition, while the melt surface differs significantly from the bulk fracture surface. Above ca. 75 m/z, the negative ion spectra are dominated by two series of homologous cluster ions with compositions of Si n O 2n+2 Al - and Si m HO 2m+1 - . The presence of these clusters suggests that analogous structures exist at the near surface regions of the samples. In a series of MCR analyses, two or three MCR components captured 〉 95% of the variance in the data for these samples. This article is protected by copyright. All rights reserved.
Print ISSN:
0002-7820
Electronic ISSN:
1551-2916
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
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