Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
66 (1995), S. 4544-4546
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
An annular-type solid state detector (SSD) was attached to a scanning x-ray analytical microscope to accomplish certain superior analytical features. The major advantages of this kind of attachment are a large solid angle for detection of scattered x rays from a small point covering the entire Debye–Sherrer ring diffracted from a polycrystalline sample. To demonstrate the above features, the crystallite distribution of an agate sample was depicted as a micrograph using the diffraction intensities of 101¯1 reflection of quartz. For comparison and to emphasize the special features of the present setup, a similar observation was also carried out by a conventional SSD. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145287
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