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  • 1
    Publication Date: 1973-07-01
    Print ISSN: 0005-2744
    Electronic ISSN: 1879-2960
    Topics: Biology
    Published by Elsevier
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  • 2
    Publication Date: 2018-06-11
    Description: Bromothymol Blue (BT)/Bromocresol Green (BG) mixture (1/1) in hydrogel (l/l), produces a blue-green indicator for HZ and/or NO2. The stability over a two months period of this BT/BG (1/1) indicator solution was tested and no evidence of performance deterioration was detected. A dual HZ/NO2 prototype sensor utilizing an acid-base indicator was previously constructed. A monitor and control circuit are also designed, built d tested during the course of this project. The circuit is controlled with Motorola MC68HC II microcontroller evaluation board to monitor the voltage level out of the photodetector. Low-pass filter and amplifier are used to interface the sensor's small voltage with the microcontroller's AD input. The sensor, interface circuit and the microcontroller board are then all placed in one unit and powered with a single power supply. The unit is then tested several times and the response was consistent and proved the feasibility of dual "J@ leak detection. Other sensor types, suitable for silica glass fiber, smaller in size, more rugged and suitable for use on board of the Space Shuttle and missile canisters, are then proposed.
    Keywords: Instrumentation and Photography
    Type: 2003 Research Reports: NASA/ASEE Fellowship Program; A-1 - A-12; NASA/CR-2003-211527
    Format: application/pdf
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  • 3
    Publication Date: 2019-08-27
    Description: Self-Validating Thermocouple (SVT) Systems capable of detecting sensor probe open circuits, short circuits, and unnoticeable faults such as a probe debonding and probe degradation are useful in the measurement of temperatures. SVT Systems provide such capabilities by incorporating a heating or excitation element into the measuring junction of the thermocouple. By heating the measuring junction and observing the decay time for the detected DC voltage signal, it is possible to indicate whether the thermocouple is bonded or debonded. A change in the thermal transfer function of the thermocouple system causes a change in the rise and decay times of the thermocouple output. Incorporation of the excitation element does not interfere with normal thermocouple operation, thus further allowing traditional validation procedures as well.
    Keywords: Electronics and Electrical Engineering
    Format: application/pdf
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  • 4
    Publication Date: 2019-07-12
    Description: An improved self-validating thermocouple (SVT) instrumentation system not only acquires readings from a thermocouple but is also capable of detecting deterioration and a variety of discrete faults in the thermocouple and its lead wires. Prime examples of detectable discrete faults and deterioration include open- and short-circuit conditions and debonding of the thermocouple junction from the object, the temperature of which one seeks to measure. Debonding is the most common cause of errors in thermocouple measurements, but most prior SVT instrumentation systems have not been capable of detecting debonding. The improved SVT instrumentation system includes power circuitry, a cold-junction compensator, signal-conditioning circuitry, pulse-width-modulation (PWM) thermocouple-excitation circuitry, an analog-to-digital converter (ADC), a digital data processor, and a universal serial bus (USB) interface. The system can operate in any of the following three modes: temperature measurement, thermocouple validation, and bonding/debonding detection. The software running in the processor includes components that implement statistical algorithms to evaluate the state of the thermocouple and the instrumentation system. When the power is first turned on, the user can elect to start a diagnosis/ monitoring sequence, in which the PWM is used to estimate the characteristic times corresponding to the correct configuration. The user also has the option of using previous diagnostic values, which are stored in an electrically erasable, programmable read-only memory so that they are available every time the power is turned on.
    Keywords: Instrumentation and Photography
    Type: KSC-12875 , NASA Tech Briefs, June 2008; 11-12
    Format: application/pdf
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  • 5
    Publication Date: 2019-07-12
    Description: In an alternative to a prior technique of time-domain-reflectometry (TDR) in which very short excitation pulses are used, the pulses have very short rise and fall times and the pulse duration is varied continuously between a minimum and a maximum value. In both the present and prior techniques, the basic idea is to (1) measure the times between the generation of excitation pulses and the reception of reflections of the pulses as indications of the locations of one or more defects along a cable and (2) measure the amplitudes of the reflections as indication of the magnitudes of the defects. In general, an excitation pulse has a duration T. Each leading and trailing edge of an excitation pulse generates a reflection from a defect, so that a unique pair of reflections is associated with each defect. In the present alternative technique, the processing of the measured reflection signal includes computation of the autocorrelation function R(tau) identical with fx(t)x(t-tau)dt where t is time, x(t) is the measured reflection signal at time t, and taus is the correlation interval. The integration is performed over a measurement time interval short enough to enable identification and location of a defect within the corresponding spatial interval along the cable. Typically, where there is a defect, R(tau) exhibits a negative peak having maximum magnitude for tau in the vicinity of T. This peak can be used as a means of identifying a leading-edge/trailing-edge reflection pair. For a given spatial interval, measurements are made and R(tau) computed, as described above, for pulse durations T ranging from the minimum to the maximum value. The advantage of doing this is that the effective signal-to-noise ratio may be significantly increased over that attainable by use of a fixed pulse duration T.
    Keywords: Electronics and Electrical Engineering
    Type: KSC-12856 , NASA Tech Briefs, December 2008; 10
    Format: application/pdf
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