ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Thermally stimulated exoelectron emission from silicon subjected to argon plasma treatment (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 7482-7486 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the thermally stimulated exoelectron emission (TSEE) from Ar plasma-treated Si by x-ray photoelectron spectroscopy and by employing a theoretical equation. The sample surfaces were exposed to ambient air after the plasma treatment. The TSEE glow curve (298–623 K) exhibited broad emission peaks at ∼373 and ∼473 K, and an increase in the intensity above 573 K. A theoretical analysis revealed that the glow curves were composed of four peaks except for the increase above 573 K, where each peak had a different trap depth, but almost the same electron affinity. The resolved two peaks in the lower temperature region increased compared to those in the higher temperature region with an increase in the O1s/Si2p ratio and also in the Si2p (oxide)/Si2p (substrate) ratio. The relationship of the surface chemical structure to the resolved four peaks is considered.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353993
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Measurement of Ar metastables near a dielectric surface in barrier and plasma display panel discharges (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 4806-4810 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The density of Ar 1s5 metastable excited atoms in the vicinity of a surface in barrier and display panel discharges was measured by the laser-induced evanescent-mode fluorescence technique. The temporal and spatial distributions of excited atoms were also measured by conventional spontaneous emission and laser absorption methods. From these measurements at various pressures, the behavior of the metastable atoms is clarified and the flux of the metastable atoms on the barrier surface is estimated. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1456961
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Field-ion scanning tunneling microscopy study of the atomic structure of 6H–SiC(0001) surfaces cleaned by in situ Si molecular beam etching (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 2524-2526 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Field ion-scanning tunneling microscopy has been used to study 6H–SiC(0001) surfaces with Si adlayers on the Si-terminated surface, formed by in situ Si molecular beam etching at 950 °C. The as-cleaned surface showed a ((square root of 3)×(square root of 3)) reconstruction. The (2×3), (2(square root of 3)×6(square root of)6), and (3×3) phases were formed by evaporating Si on this clean 6H–SiC(0001)-((square root of 3)×(square root of 3)) surface. A Si(111) film 6 monolayers thick was also epitaxially grown on the 6H–SiC(0001)-((square root of 3)×(square root of 3)) surface at 800 °C, and the surface exhibited the Si(111)–(7×7) reconstruction. A surface vacancy model for the ((square root of 3)×(square root of 3)) reconstruction is proposed, and a possible application of utilizing the various surface reconstructions to control the growth of different polytypes of SiC on the 6H–SiC substrate is discussed. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363037
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    High density recorded patterns observed by high-resolution Bitter scanning electron microscope method : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6074-6076 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have developed a new and versatile method for observation of fine domain structures in ferromagnetic specimens. In this method, which we call here the high-resolution Bitter scanning electron microscope (HRBS) method, ferromagnetic fine particles as small as 20 nm are fabricated by sputtering, and are subsequently deposited on the surface of ferromagnetic samples to be investigated. The particles form very faithful domain patterns reflecting the leakage field distribution from the samples. We have applied this method to several magnetic and magneto-optic high density recording media, and have successfully observed the bit patterns at a recording density of 300 kFCI (bit length ∼80 nm). Moreover, we have confirmed that the HRBS method is also effective in investigating the magnetized states within each recording bit. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362097
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Magnetoresistance and phase decomposition in Cr-Fe bulk alloys (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 5843-5849 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report magnetoresistance in Cr-Fe bulk alloys and its variations associated with the microstructure change due to the phase decomposition. Large negative magnetoresistance (MR) is observed in the as-quenched Cr-Fe bulk alloy at liquid helium temperature, but not at room temperature. This is attributed to the spin cluster glass in the homogeneous solid solution. A unique feature of the MR in these homogenous alloys is that it does not saturate even in the presence of very high magnetic fields. However, such MR behavior changes when ferromagnetic particles precipitate by annealing. A lower degree of compositional fluctuation of Fe progresses by annealing the alloy at 773 K for 400 h and then a higher degree of decomposition occurs after a prolonged aging for 2600 h. In the annealed specimens, MR is observed even at room temperature. The MR change becomes more prominent at a lower field region, since ferromagnetic particles precipitate from the solid solution. The degree of the phase decomposition of the Cr-Fe solid solution is quantitatively evaluated by the atom probe analysis, and the origin of the MR dependence on the annealing conditions is discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359165
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 6
    Electronic Resource
    Electronic Resource
    Compositional inhomogeneities in sputtered Co-Cr magnetic thin films studied by atom probe field ion microscopy (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 8025-8031 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Compositional inhomogeneities in Co-22 at. % Cr sputtered thin films have been studied quantitatively using atom probe field ion microscopy. For comparison, a Co-22 at. % Cr bulk alloy specimen has also been examined. As predicted from the recently published phase diagram, a solution treated Co-Cr bulk alloy specimen does not contain detectable chemical inhomogeneities. On the other hand, the Co-22 at. % Cr thin film sputter deposited at 200 °C consists of two distinct phases with different Cr concentrations. The size of each phase is in the order of 8 nm which is significantly smaller than the grain size of the specimen; however, the film that was sputter deposited at ambient temperature exhibited a significantly lower level of compositional inhomogeneity. Based on these results, it is concluded that the phase separation progresses when thin films are deposited on heated substrates. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357921
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 7
    Electronic Resource
    Electronic Resource
    Atom probe analysis of Fe73.5Si13.5B9Nb3Cu1 nanocrystalline soft magnetic material (1991)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 58 (1991), S. 2180-2182 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The microstructure of Fe73.5Si13.5B9Nb3Cu1 soft magnetic material with a nanocrystalline structure has been investigated by atom probe field ion microscopy. In the as-quenched amorphous sample, all the alloying elements were found to distribute homogeneously as an amorphous solid solution. In the annealed sample with the optimum soft magnetic properties, we found that two phases were present. One was Fe-Si solid solution and the other was the B- and Nb-enriched region with less Si content. Although some uncertainty remains regarding Cu, the present result is consistent with an early speculation based on the lattice parameter measurement.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.104968
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 8
    Electronic Resource
    Electronic Resource
    Structure and magnetism of hcp-Co fine particles (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 1858-1862 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have synthesized hcp-Co fine particles with the average diameter of less than 50 nm by sputtering Co in a somewhat high inert gas pressure. A nearly perfect hcp phase can be stabilized by increasing sputtering gas pressure and decreasing sputtering power in contrast to conventional preparation conditions. Magnetic measurements have revealed the clear relation of coercivity with the volume ratio of hcp phase. That is, the increase in the hcp phase considerably enhances the coercivity. Appearance of the hcp phase seems to be related to the promotion of allotropic phase transformation in Co initiated by lattice defects within each particle. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.364041
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 9
    Electronic Resource
    Electronic Resource
    Structure determination of the N-methyl isomers of 5-amino-3,4-dicyanopyrazole and certain related pyrazolo[3,4-d]pyrimidines (1975)
    s.l. : American Chemical Society
    The @journal of organic chemistry 40 (1975), S. 1815-1822 
    Details
    ISSN: 1520-6904
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/jo00900a029
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 10
    Electronic Resource
    Electronic Resource
    Three-dimensional atom probe analysis of Co–Cr–Ta thin film (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 3095-3097 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Three-dimensional elemental mappings of Co–Cr–Ta thin film sputter-deposited at 200 °C were obtained using a three-dimensional atom probe. We have confirmed that Ta atoms are dissolved in the film homogeneously, and no segregation of Ta was found at the grain boundaries. On the other hand, Cr atoms are inhomogenously dissolved within grains, and it is strongly enriched at the grain boundaries forming a Cr-enriched grain boundary phase with a thickness of approximately 4 nm. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.117316
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...