Digitale Medien
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
74 (1999), S. 2462-2464
ISSN:
1077-3118
Quelle:
AIP Digital Archive
Thema:
Physik
Notizen:
Using femtosecond time resolved reflectivity, we have characterized the dynamics of photoinduced generated carriers in a polycrystalline low-temperature-grown GaAs sample. Our measurements are fitted with an analytical expression reliable for low pump power experiments. The sample, which presents no As precipitates, shows an ultrafast subpicosecond response together with a longer picosecond tail that we attribute to the midgap defect states. Moreover, we have observed the influence of surface roughness on the differential reflected signal. © 1999 American Institute of Physics.
Materialart:
Digitale Medien
URL:
http://dx.doi.org/10.1063/1.123881
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