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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 3459-3463 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Bulk polycrystalline cadmium manganese telluride, Cd1−xMnxTe, was manufactured in several compositions by a synthesis process. The structure of the obtained compounds was the characteristic zinc-blende polycrystalline pattern being the grain size 100±20 nm. These materials are manufactured to replace single-crystal compounds in some magneto-optical devices. The cut-off wavelength and the Verdet constant are the same as the single-crystals with identical composition. A polarized laser beam, after having passed through a sample of 0.76 mm thickness, was depolarized less than 2.5%, and 90% of its energy was spread into a 2° cone. Scattering of light is produced because of the polycrystalline structure of these compounds. Some scattering diagrams, due to the diffraction and Mie scattering in the polycrystalline grains are shown.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 4988-4997 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The properties of deep donor states (DX centers) in III-V alloys are discussed in relation to their influence on device characteristics and performance. The techniques to avoid or minimize such deleterious effects in AlGaAs-based devices are discussed, along with their physical basis, and some guidelines for improved III-V device design are established. New results about the benefits of proper donor selection, the role of In alloying, the advantage of δ doping in layers and in modulation-doped devices, and the use of AlInAs and InGaP as alternative wide band-gap III-V alloys are presented.
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We measure the per-carrier nonlinear responses caused by photoexcited carriers in two strained [111]-oriented InGaAs/GaAs multiple-quantum-well structures, and we compare them to that measured in a [100]-oriented structure. Without an external bias, we find that the absorption coefficient changes per photogenerated carrier for the [111]-oriented piezoelectric materials are smaller than for the [100]-oriented materials, not larger, as originally suggested. Subsequently, measurements of the per-carrier nonlinear responses as a function of reverse bias voltage demonstrate that the smaller per-carrier nonlinearities measured for the [111] structures are partially the result of a broadening of the excitons by the huge in-well fields, but can be primarily attributed to the quality of the [111]-grown materials. When corrected for differing in-well fields and for differing excitonic linewidths, the per-carrier responses are similar in magnitude, suggesting that the [111] response may eventually approach that of [100] material, but probably will not significantly exceed it. © 1996 American Institute of Physics.
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  • 4
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The use of room- and low-temperature photoluminescence (PL) spectroscopy for the assessment of n-type pseudomorphic AlGaAs/InGaAs/GaAs high-electron-mobility transistor structures is reported. We describe a method to determine the InAs mole fraction x, the channel layer thickness L, and the confined two-dimensional electron gas density (ns), based on the comparison between the PL transitions and the recombination energies derived from self-consistent calculations of the subband structure. A detailed analysis of the optical transitions and their dependence on the Fermi level position and temperature is performed. It is shown that, in real devices, the high sensitivity of the recombination energies and intensities on small changes of the parameters x, L, and ns allows us to detect deviations from their nominal structural parameters within the uncertainty of the molecular beam epitaxy growth technique. The present assessment procedure has been applied to a significant number of samples, and it has been backed by independent measurements of these parameters by more sophisticated techniques such as Shubnikov–de Haas and PL excitation in standard and gated samples, and by physical techniques like transmission electron microscopy and Auger spectroscopy.
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  • 5
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: By embedding piezoelectric InGaAs/GaAs multiple quantum wells (MQWs) in specifically designed p-i-n structures, we demonstrate that the nonlinear optical response can be used to identify the dominant screening mechanisms and simultaneously to determine the strain distribution. Furthermore, we show that a knowledge of the screening mechanisms and spatial band structure, in turn, can be used to control the nonlinear optical response. For this demonstration, we fabricate two p-i(MQW)-n samples on [111]-oriented GaAs substrates. The samples are designed such that, if the dominant screening is associated with photogenerated carriers that remain in the wells, a blue shift of the exciton would be expected in each. By contrast, if the screening is associated with carriers that have escaped the wells and moved to screen the entire MQW, one will shift to the blue and the other to the red if the lattice is mechanically clamped, but both will shift to the red if the lattice is mechanically free. The observation of a blue shift and a red shift indicates that, while in-well screening may be present, the dominant screening is out-of-well and that these particular structures are mechanically clamped to the lattice constant of the GaAs. Most importantly, these results illustrate the added flexibility that the piezoelectric field gives in tailoring the nonlinear optical response. © 1994 American Institute of Physics.
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  • 6
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-resolution x-ray diffractometry has been applied to the structural characterization of piezoelectric strained InGaAs/GaAs multiquantum well p-i-n diodes grown by molecular beam epitaxy on (111)B GaAs substrates. Reference samples simultaneously grown on (001) GaAs have been also characterized. Diodes with 3, 7, and 10 periods and different well to barrier thickness ratio have been studied. Symmetric and asymmetric reflections at various azimuths were measured and the scans were fitted with theoretical curves obtained through a dynamical simulation program developed in our lab. The comparison between experimental and simulated profiles has enabled us to determine the main structural parameters of the samples. High-resolution x-ray diffractometry provided accurate data about period and capping layer thicknesses, indium content in the wells and state of relaxation, information which cannot be always obtained in (111)B samples from other characterization techniques such as photoluminescence or photocurrent spectroscopies. © 1996 American Institute of Physics.
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  • 7
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 104 (1996), S. 1179-1186 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Rotational spectra for endohedral Li+@C60 and Na+@C60 are calculated at different temperatures. Most of the features in these spectra are related with the degree of anisotropy in the atom–cage interaction. While the low anisotropy for Na+@C60 results in rather simple spectra with the 2B oscillation typical of a diatomic molecule, the more eccentric and anisotropic Li+@C60 produces complex spectra with rotational and librational bands. Some interesting effects are induced by the cage rotation, which has been incorporated through a semiclassical formalism. © 1996 American Institute of Physics.
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  • 8
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thickness effects of the InGaAs channel on photoluminescence and transport properties of δ-doped Al0.3Ga0.7As/In0.3Ga0.7As heterostructures are investigated. The spreading of the Si δ-doping layer is deduced from a comparison of the measured charge with self-consistent calculations assuming a Gaussian Si distribution profile and a definite ionization probability of the Si-related DX centers. With decreasing channel thickness below 80 A(ring), the effect of the spreading on the sheet carrier concentration increases and the low temperature mobility decreases due to roughness scattering at the In0.3Ga0.7As/GaAs interface. In channels thicker than 80 A(ring) the thickness-independent alloy scattering process dominates.
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 1239-1241 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Films of CuGaxIn(1−x)Se2 (CGIS) have been grown by rf sputtering from stoichiometric single targets with different Ga/In ratios. Adjusting growth temperature and argon pressure we are able to deposit films with a wide range of Cu contents: From CGIS Cu-poor (16 at. %) to Cu2Se. Reevaporation of (Ga,In)2Se3 binaries is observed when substrate temperature is increased at a constant argon pressure (20 mTorr). An increase in Ar pressure from 5 to 150 mTorr at a growth temperature of 450 °C, produces a decrease in Cu atomic percentage from 24% to 16% due to a preferential diffusion of Cu sputtered atoms in the plasma. The relevant film properties of the analyzed films are found to be ruled by the Cu content. Graded composition absorbers with adequate physical properties for the fabrication of photovoltaic devices are grown with a proper choice of growth parameters.
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 1072-1074 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The addition of a piezoelectric field in AlGaAs/InGaAs/GaAs HEMT structures is shown to lead to enhanced electron densities and hence improved device performance. Growth of a strained InxGa1−xAs layer is in [111]A direction causes a piezoelectric field to be built into the quantum well of a pseudomorphic HEMT, which opposes the electric field due to charge transfer and hence lowers the confinement energy. This leads to carrier densities 50% larger than in equivalent [100] structures, with the wave function also spaced further away from the dopant impurities and the well interfaces. We expect these factors to give improved device performance.
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