Publication Date:
2011-05-05
Description:
Author(s): Georg Rossbach, Martin Feneberg, Marcus Röppischer, Christoph Werner, Norbert Esser, Christoph Cobet, Tobias Meisch, Klaus Thonke, Armin Dadgar, Jürgen Bläsing, Alois Krost, and Rüdiger Goldhahn The optical properties around the absorption edge of high-quality wurtzite c-plane AlN layers are investigated by spectroscopic ellipsometry focusing on the anisotropy of the optical response. The spectral dependence of dielectric function shows a strong contribution of exciton-phonon coupling super... [Phys. Rev. B 83, 195202] Published Wed May 04, 2011
Keywords:
Semiconductors I: bulk
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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