ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new Fourier transform ion cyclotron resonance mass spectrometer is described in three sections: magnet, vacuum system, and electronics/data system. Each component is described in detail (e.g., manufacturer's part numbers, drawings, circuit schematics, etc.). Of special interest is the high-frequency signal generation and processing required to extend the lower-mass limit for singly charged ions to 1 u. In particular, two new multiple heterodyne techniques for high-frequency measurements are described, as well as a method for producing a long-duration electron beam, and the implementation of z-axis ejection for selective removal of unwanted ions of various mass-to-charge ratios.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144021
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