Publication Date:
2017-10-11
Description:
Author(s): C. Kwamen, M. Rössle, M. Reinhardt, W. Leitenberger, F. Zamponi, M. Alexe, and M. Bargheer Monitoring structural changes in ferroelectric thin films during electric field induced polarization switching is important for a full microscopic understanding of the coupled motion of charges, atoms, and domain walls in ferroelectric nanostructures. We combine standard ferroelectric test sequences... [Phys. Rev. B 96, 134105] Published Tue Oct 10, 2017
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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