ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A microscale ion trap mass spectrometer (r0=0.50 mm, z0=0.55 mm) with an electron gun for electron impact ionization of gaseous samples is described. Operated in the mass-instability mode, the trap had a m/z range from 40 to 400 Da. For single scans, peak widths of less than 0.2 Da were obtained. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1150010
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