Publication Date:
2019-07-13
Description:
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects, total ionizing dose and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others.
Keywords:
Spacecraft Instrumentation and Astrionics
Type:
2002 IEEE Nuclear and Space Radiation Effects Conference; Jul 15, 2002 - Jul 19, 2002; Phoenix, AZ; United States
Format:
application/pdf
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