Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
78 (2001), S. 1745-1747
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We report on the origin of interference patterns at the edge of nanometer-scale Co protrusions observed by low-energy electron point source (LEEPS) microscopy. We find evidence that those interference patterns are due to the phase shift of a coherent electron beam by a localized magnetic field. Typical interference patterns have an apparent size of 10–100 nm and a star-like shape, which are dependent on the sharpness of the Co protrusion. After preparing a ferromagnetic nanoparticle in a saturation remanent state by applying a strong magnetic field, we observed the deflection of the interference pattern. This phenomenon is consistent with the theoretical prediction based on a magnetostatic model. The capability of mapping the local magnetic field suggests that LEEPS microscopy is potentially applicable as an imaging tool of magnetic field with nanometer-scale resolution. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1352693
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