Publication Date:
2015-04-03
Description:
Scanning electron microscopy (SEM) for observing samples at ambient atmospheric pressure is introduced in this study. An additional specimen chamber with a small window is inserted in the main specimen chamber, and the window is separated with a thin membrane or diaphragm allowing electron beam propagation. Close proximity of the sample to the membrane enables the detection of back-scattered electrons sufficient for imaging. In addition to the empirical imaging data, a probability analysis of the un-scattered fraction of the incident electron beam further supports the feasibility of atmospheric SEM imaging over a controlled membrane–sample distance.
Print ISSN:
0022-0744
Electronic ISSN:
1477-9986
Topics:
Electrical Engineering, Measurement and Control Technology
,
Natural Sciences in General
,
Physics
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