ISSN:
1662-9779
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Physics
Notes:
The crystallization of α-Fe2O3/α-Al2O3(0001) thin films has been studied using real-timesynchrotron x-ray scattering and atomic force microscope. In the sputter-grown amorphous films ofvarious thicknesses at room temperature, we find the coexistence of α-Fe2O3 and Fe3O4 interfacialcrystallites (~50-Å-thick), well aligned to the α-Al2O3[0001] direction. The amorphous precursor iscrystallized to the epitaxial α-Fe2O3 grains in three steps with annealing temperature; i) the growth ofthe well aligned α-Fe2O3 interfacial crystallites to approximately 200-Å-thick, together with thetransformation of the Fe3O4 crystallites to the α-Fe2O3 crystallites (〈 400℃), ii) the growth of the lessaligned α-Fe2O3 grains on top of the well aligned grains (〉 400℃), and iii) the nucleation of thedifferent less aligned α-Fe2O3 grains directly on the α-Al2O3 substrate (〉 600℃). The surfaceevolution of the amorphous precursor films after annealing is consistent with the microstructureevolution during the crystallization
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/02/23/transtech_doi~10.4028%252Fwww.scientific.net%252FSSP.124-126.1213.pdf
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