ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A novel apparatus allowing the simultaneous observation of small angle x-ray scattering and time dependent birefringence changes of a dynamic system is described. The apparatus incorporates a monochromatic light source, polarizers, a fast photodiode detector, and electric field generating equipment, such that electro-optic response times between 10 μs and 100 s may be measured. The electro-optic apparatus is incorporated in an x-ray camera sited at the Synchrotron Radiation Source at Daresbury Laboratory, UK. The x-ray apparatus allows the study of structures ∼30 A(ring) in dimension and the detector is time resolved with a minimum response time of 10 μs. A hot stage and temperature controller are also incorporated into the apparatus, allowing the study of smectic liquid crystal devices. Results from the simultaneous acquisition of time resolved x-ray scattering data and electro-optic measurements from a thin film of smectic-A liquid crystal are presented. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145470
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