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  • 1
    ISSN: 1432-1939
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Summary Plant xylem pressure potentials and leaf conductances to water loss were measured in the spring and summer at two sites in the western Cape Province, Republic of South Africa. The measurements were to test the hypothesis that the fynbos of South Africa was equivalent to the chaparral of California, therefore a period of plant water stress, similar to the period measured in chaparral species, should occur in flynbos species during the dry summer. The measurements indicated little or no plant water stress in most fynbos species at both sites. The sites were similar in plant water relations in spite of a more than twofold difference in annual precipitation. The minor differences in plant water relations can be explained in terms of different vegetation cover and different vapor pressure deficits during the measurements. The results support the conclusion that the arid fynbos may be equivalent to chaparral, but the majority of the fynbos is equivalent to coniferous and broad-leaved evergreen forest in California.
    Type of Medium: Electronic Resource
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  • 2
    Publication Date: 1983-02-01
    Print ISSN: 0029-8549
    Electronic ISSN: 1432-1939
    Topics: Biology
    Published by Springer
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  • 3
  • 4
    Publication Date: 2024-03-15
    Description: The assimilation and regeneration of dissolved inorganic nitrogen, and the concentration of N2O, was investigated at stations located in the NW European shelf sea during June/July 2011. These observational measurements within the photic zone demonstrated the simultaneous regeneration and assimilation of NH4+, NO2- and NO3-. NH4+ was assimilated at 1.82-49.12 nmol N/L/h and regenerated at 3.46-14.60 nmol N/L/h; NO2- was assimilated at 0-2.08 nmol N/L/h and regenerated at 0.01-1.85 nmol N/L/h; NO3-was assimilated at 0.67-18.75 nmol N/L/h and regenerated at 0.05-28.97 nmol N/L/h. Observations implied that these processes were closely coupled at the regional scale and that nitrogen recycling played an important role in sustaining phytoplankton growth during the summer. The [N2O], measured in water column profiles, was 10.13 ± 1.11 nmol/L and did not strongly diverge from atmospheric equilibrium indicating that sampled marine regions were neither a strong source nor sink of N2O to the atmosphere. Multivariate analysis of data describing water column biogeochemistry and its links to N-cycling activity failed to explain the observed variance in rates of N-regeneration and N-assimilation, possibly due to the limited number of process rate observations. In the surface waters of five further stations, ocean acidification (OA) bioassay experiments were conducted to investigate the response of NH4+ oxidising and regenerating organisms to simulated OA conditions, including the implications for [N2O]. Multivariate analysis was undertaken which considered the complete bioassay data set of measured variables describing changes in N-regeneration rate, [N2O] and the biogeochemical composition of seawater. While anticipating biogeochemical differences between locations, we aimed to test the hypothesis that the underlying mechanism through which pelagic N-regeneration responded to simulated OA conditions was independent of location. Our objective was to develop a mechanistic understanding of how NH4+ regeneration, NH4+ oxidation and N2O production responded to OA. Results indicated that N-regeneration process responses to OA treatments were location specific; no mechanistic understanding of how N-regeneration processes respond to OA in the surface ocean of the NW European shelf sea could be developed.
    Keywords: Alkalinity, total; Ammonia, oxidation rate; Ammonia, oxidation rate, standard deviation; Ammonium; Ammonium, standard deviation; Ammonium regeneration rate; Ammonium regeneration rate, standard deviation; Aragonite saturation state; Bacteria; Bicarbonate ion; Biomass/Abundance/Elemental composition; Bottles or small containers/Aquaria (〈20 L); Calcite saturation state; Calculated using CO2SYS; Calculated using seacarb after Nisumaa et al. (2010); Carbon, inorganic, dissolved; Carbonate ion; Carbonate system computation flag; Carbon dioxide; Coast and continental shelf; Coulometric titration; D366_E1; D366_E2; D366_E3; D366_E4; D366_E5; Dimethyl sulfide; Dimethylsulfoniopropionate; Entire community; Event label; EXP; Experiment; Flag; Fugacity of carbon dioxide (water) at sea surface temperature (wet air); Identification; Laboratory experiment; Nanoflagellates, heterotrophic; Nitrate; Nitrous oxide, dissolved; North Atlantic; OA-ICC; Ocean Acidification International Coordination Centre; Open ocean; Other metabolic rates; Partial pressure of carbon dioxide (water) at sea surface temperature (wet air); Pelagos; pH; Phosphate; Potentiometric titration; Salinity; Silicate; Temperate; Temperature, water; Time in hours; Treatment; UKOA; United Kingdom Ocean Acidification research programme
    Type: Dataset
    Format: text/tab-separated-values, 12526 data points
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 36 (1932), S. 2194-2204 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 38 (1934), S. 663-674 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 93 (1989), S. 457-462 
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 488-494 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electron, ion, and x-ray lithography are all being advocated as replacements for optical lithography at some time in the future for high-volume production of integrated circuits. Of some concern is the potential for radiation damage to underlying circuit layers caused by these lithographies. In this paper we report results of an experiment designed specifically to compare damage to radiation-hardened circuits arising from the three nonoptical lithographic technologies. We employ flood exposures of metal-oxide-semiconductor (MOS) capacitors by electrons, ions, and x rays to simulate lithographic exposures. We report results of characterizations by capacitance-voltage analysis, radiation-hardness testing, and bias-stress testing. Degradation in radiation hardness is used as measure of residual damage caused by the simulated lithographic irradiations that is not annealed out at low temperatures. We find minimal damage to the oxide resulting from lithographic doses of ions. We measure voltage shifts due to oxide- and interface-trap charge introduced by x rays and electrons and find that they can be removed by standard post-metallization anneals. We find that the radiation tolerance of MOS capacitors so irradiated and annealed is nearly identical to that of devices that did not see irradiation and annealing. Moreover, in all cases, no bias-temperature instabilities resulted from the exposure-anneal sequences. We find that all three types of lithographic techniques are promising candidates for use in advanced, radiation-hardened integrated circuit technologies.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 91 (1989), S. 4468-4476 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The BH2 and CH−2 radicals have been generated and trapped in rare gas matrices for ESR (electron spin resonance) investigation. Theoretical calculations were conducted on these radicals and the CH+2 cation for detailed comparison with the experimental results. The observed magnetic parameters (MHz) for 13 CH−2 in neon matrices at 4 K were: giso =2.0027(3); 13 C; ||Aiso||=59(1) and H; ||Aiso||=45(1). For 11 BH2 in argon at 4 K the results were: giso =2.0016(3); 11 B; Aiso=358(2) and H; ||Aiso||=38(1). The electronic structure information obtained for these small radicals from theoretical and experimental results is discussed and compared with other related molecules.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 88 (1988), S. 2226-2234 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: ESR results are reported for the cation radicals 15 N212 CO+ , 15 N213 CO+ and 14 N213 CO+ trapped as isolated ions in neon matrices at 4 K. The N2CO+ radical was generated by codepositing N2 and CO into a neon matrix under ionizing conditions (both photoionization at 16.8 eV, and 50 eV electron bombardment). A complete resolution of the 14 N, 15 N, and 13 C A tensors reveal that the radical is planar and nonlinear (NNC O). Electronic structure changes that occur as N+2 and CO (or CO+ with N2) combine to form N2CO+ are analyzed by comparing the nuclear hfs of the diatomic reactants with that of the product radical. The 13C hfs is extremely large with Ax =1376(1); Ay =1407(1), and Az =1403(1) MHz. The A tensor for the inner 14 N atom is: Ax,y =200.2(6) and Az =226.6(3) MHz. The outer 14 N has ||Ax,y|| =4(1) and Az =9.4(2) MHz. The nuclear g tensor appears axially symmetric with gx,y=2.0007(3) and gz =2.0002(3). SCF calculations also show N2 CO+ to be nonlinear and yield A values in reasonably good agreement with experiment. These ESR results for N2CO+ are compared with similar measurements for the isoelectronic ions C2O+2, N+4, and C2N−2.
    Type of Medium: Electronic Resource
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