Publication Date:
2015-12-18
Description:
Author(s): Y. B. Gerbig, C. A. Michaels, J. E. Bradby, B. Haberl, and R. F. Cook Indentation-induced plastic deformation of amorphous silicon (a-Si) thin films was studied by in situ Raman imaging of the deformed contact region of an indented sample, employing a Raman spectroscopy-enhanced instrumented indentation technique. Quantitative analyses of the generated in situ Raman m… [Phys. Rev. B 92, 214110] Published Thu Dec 17, 2015
Keywords:
Structure, structural phase transitions, mechanical properties, defects
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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