ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The progress in the quality of XUV and soft x-ray optics requires adapted methods of control. Knife-edge methods have numerous interesting aspects, yielding the information that is usually sought in optical systems. Preliminary results are given, obtained with a simple XUV photodiode as detector. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145699
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