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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Acta mechanica solida Sinica 1 (1988), S. 51-60 
    ISSN: 0894-9166
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract A CCT experiment controlled by pseudo random signals generated by a white-noise generator with narrow-band filter has been done in the MTS-880 system to compare the effects of different δK char on dα/dt. A fatigue crack growth life prediction formula which is only dependent on Power Spectrum Density (P. S. D.) of the history under Gaussian narrow-band history is derived. The theoretical results are in good agreement with the experimental ones.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Acta mechanica solida Sinica 2 (1989), S. 349-361 
    ISSN: 0894-9166
    Keywords: random spectrum loading ; fatigue crack life ; overload retardation ; load interaction ; compression effects ; residual deformation ; crack closure ; life prediction
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The effects of plastic zones both in front of and behind crack tip on crack closure have been analysed. The total residual deformations of crack surfaces involve two parts, that is, the amount of plastic blunting of crack tip and the residual deformation in the wake of the tip. This paper presents a fatigue crack closure model in which the influences of compressive load on closure stress are discussed. The model is applied to random loading conditions by the assumption of “limited memory” properties. The fatigue lives are predicted using the proposed crack growth model for CCT plane stress specimen cut from 2219-T851 aluminum alloy under flight spectrum loadings, and the prediction values agree with the test results.
    Type of Medium: Electronic Resource
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