Publication Date:
2013-08-31
Description:
The aim of the long wavelength spectrometer (LWS) of the Infrared Space Observatory is to perform spectrometry in the wavelength range 45 to 200 microns using two resolution modes. The resolution will be around 200 in the medium resolution mode while it will reach 10(exp 4) in the high resolution mode. The sensitivity of this instrument will be close to 10(exp -18) W/sq. root Hz. A schematic view of the focal plane unit is presented. The detectors divide the wavelength range into ten spectral channels. The spectral range and position of each detector is indicated. Each detector will cover approximately a spectral bandwidth sufficient to allow for a 50 percent redundancy in the case of detector failure. There are three types of detectors. SW1 is a Ge:Be photoconductor covering the 45 to 55 micron region. LW1, SW2, SW3, SW4, SW5 are unstressed Ge:Ga photoconductors which cover the 50 to 120 micron region. LW2, LW3, LW4, LW5 are uniaxially stressed Ge:GA photoconductors covering the range from 100 to 200 microns. The stress applied to each detector will be adjusted in order to get the peak response in the corresponding wavelength range, and to minimize the dark current of the shorter wavelength stressed detectors. Stressed and unstressed detectors are located alternatively in order to receive the first and second order of the diffracted beam.
Keywords:
INSTRUMENTATION AND PHOTOGRAPHY
Type:
NASA, Ames Research Center, Proceedings of the Third Infrared Detector Technology Workshop; p 365-380
Format:
application/pdf
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