Electronic Resource
College Park, Md.
:
American Institute of Physics (AIP)
The Journal of Chemical Physics
96 (1992), S. 2846-2855
ISSN:
1089-7690
Source:
AIP Digital Archive
Topics:
Physics
,
Chemistry and Pharmacology
Notes:
The concentration of O atoms in xenon matrices at 32 and 40 K is followed by monitoring 736 nm emission from XeO* excimers. Emission is induced by excitation of O atom Xe pairs with 193 or 248 nm radiation. O atoms are initially produced via UV photolysis of N2O. At 32 K, approximately 50% of the atoms present after the initial probe pulse persist after eight days. The most likely mechanism for O atom decay is O+O recombination. At both temperatures, the time dependence of the concentration of O atom decay cannot be fit to a single bimolecular decay. It can, however, be fit to two (or more) bimolecular decays. Based on this mechanism, diffusion coefficients for the longer time scale diffusion process are 5.4×10−18 and 2.0×10−17 cm2/s at 32 and 40 K, respectively. Other possible explanations for the observed O atom time dependence are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.461981
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