Publication Date:
2014-12-17
Description:
Article Advances in electron microscopy are enabling ever smaller features to be probed, with the measurement of atomic electric fields standing as a major challenge. Towards that aim, Müller et al. present a simplified theoretical approach for enhancing the resolution in differential phase contrast microscopy. Nature Communications doi: 10.1038/ncomms6653 Authors: Knut Müller, Florian F. Krause, Armand Béché, Marco Schowalter, Vincent Galioit, Stefan Löffler, Johan Verbeeck, Josef Zweck, Peter Schattschneider, Andreas Rosenauer
Electronic ISSN:
2041-1723
Topics:
Biology
,
Chemistry and Pharmacology
,
Natural Sciences in General
,
Physics
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