ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
A lattice-parameter measurement technique using two lattice planes and monochromatic X-ray beams has been investigated. Accuracy, measurement correction and extensions of the technique are discussed. With this technique, the lattice parameters of Gd3Ga5O12, single crystals, grown under different conditions, have been measured to an accuracy of ±0.0003 Å. From the results obtained for Gd3Ga5O12, single crystals, it has been found that the technique has several advantages in comparison with conventional methods.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S002188987601145X
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