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  • 1
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    In:  CASI
    Publication Date: 2013-08-31
    Description: NEPP program objectives are to: (1) Access the reliability of newly available electronic parts and packaging technologies for usage on NASA projects through validations, assessments, and characterizations, and the development of test methods/tools; (2)Expedite infusion paths for advanced (emerging) electronic parts and packaging technologies by evaluations of readiness for manufacturability and project usage consideration; (3) Provide NASA projects with technology selection, application, and validation guidelines for electronic parts and packaging hardware and processes; nd (4) Retain and disseminate electronic parts and packaging quality assurance, reliability validations, tools, and availability information to the NASA community.
    Keywords: Electronics and Electrical Engineering
    Format: application/pdf
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  • 2
    facet.materialart.
    Unknown
    In:  Other Sources
    Publication Date: 2018-06-08
    Description: GaAs and InP devices in hermetically sealed packages have been observed to exhibit unacceptable degradation in both RF and DC characteristics. This degradation has been observed to occur at temperatures as low as 125oC. The source of the degradation has been linked to hydrogen gas that has been absorbed in the package's metals (Kovar, plating, etc.) and converted into atomic hydrogen within the Pt or Pd metallization of the gate structure. Subsequently, atomic hydrogen diffuses into the channel region of the FET structure and neutralizes the Si donors, resulting in a degradation of the device characteristics.
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  • 3
    facet.materialart.
    Unknown
    In:  Other Sources
    Publication Date: 2018-06-08
    Description: It has been observed that GaAs devices mounted in hermetically sealed packages, and exposed to burn-in and lifetest temperatures as low as 125 C, exhibit performance degradation in both RF and DC characteristics after relatively short periods of test time (500 hours). This paper will provide a discussion and summary of the general understanding of the failure mechanisms associated with this.
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  • 4
    facet.materialart.
    Unknown
    In:  Other Sources
    Publication Date: 2018-06-08
    Description: It has been observed that GaAs devices in hermetically sealed packages when exposed to temperatures as low as 125oC can exhibit unacceptable degradation in both RF and DC characteristics. The source of the problem was found to be hydrogen that has been absorbed in the package's metals (Kovar, plating, etc.) and converted into atomic hydrogen within the Pt metallization of the gate structure. Subsequently, atomic hydrogen diffuses into the channel region of the FET structure and neutralizes the Si donors, resulting in a degradation of the device characteristics. Most of the data indicates the onslaught of the problem to occur after 500 hours at 125oC. This onslaught has been observed to be dependent on the thickness and processing conditions of the passivation layer, the sealing environment, and the amount of Pt or Pd in the gate structure of the device.
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  • 5
    Publication Date: 2019-07-13
    Description: The Gravity Recovery and Climate Experiment - Follow-On (GRACE-FO) Mission is a NASA directed mission to continue the goals of the original GRACE mission and provide continuity for the GRACE data set. The GRACE-FO mission is the result of an international cooperation to develop a concept and approach that minimizes cost and risk and maximizes the probability of success through limited changes to the original GRACE system design. The result is a system architecture in which maintenance of heritage is paramount, including heritage derived through the partnership with the German Research Centre for Geosciences (GFZ) in Germany. As a secondary goal, GRACE-FO will carry a Laser Ranging Interferometer (LRI) as a technology demonstration, which will provide laser interferometry measurements of inter-satellite range, complementary to the K/Ka-Band microwave link to demonstrate laser-ranging technology in support of future GRACE-like missions. Another secondary objective is the continuation of GRACE radio occultation measurements.
    Keywords: Earth Resources and Remote Sensing
    Type: JPL-CL-16-6212 , 2017 IEEE Aerospace Conference; Mar 04, 2017 - Mar 11, 2017; Big Sky, MT; United States|2017 IEEE Aerospace Conference
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  • 6
    Publication Date: 2019-07-13
    Description: Congress authorized NASA?s Prometheus Project in February 2003, with the first Prometheus mission slated to explore the icy moons of Jupiter. The Project had two major objectives: (1) to develop a nuclear reactor that would provide unprecedented levels of power and show that it could be processed safely and operated reliably in space for long-duration, deep-space exploration and (2) to explore the three icy moons of Jupiter - Callisto, Ganymede, and Europa - and return science data that would meet the scientific goals as set forth in the Decadal Survey Report of the National Academy of Sciences. Early in Project planning, it was determined that the development of the Prometheus nuclear powered Spaceship would be complex and require the intellectual knowledge residing at numerous organizations across the country. In addition, because of the complex nature of the Project and the multiple partners, approaches beyond those successfully used to manage a typical JPL project would be needed. This paper1 will describe the key experiences in managing Prometheus that should prove useful for future projects of similar scope and magnitude
    Keywords: Spacecraft Propulsion and Power
    Type: 2006 IEEE Aerospace Conference; Mar 04, 2006 - Mar 11, 2006; Big Sky, MT; United States
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  • 7
    Publication Date: 2019-07-13
    Description: This paper presents a statistical approach to characterizing the reliability of systems with HBT devices. The proposed approach utilizes the statistical reliability information of the HBT individual devices, along with the analysis on the critical paths of the system, to provide more accurate and more comprehensive reliability information about the HBT systems compared to the conventional worst-case method.
    Keywords: Electronics and Electrical Engineering
    Type: 19th Annual Workshop on Compound Semiconductor Reliability; Oct 24, 2004; Monterey, CA; United States
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  • 8
    Publication Date: 2019-08-15
    Description: Application of semiconductor devices in high reliability space systems requires a thorough understanding of the reliability and failure mechanisms associated with the selected devices. This paper provides a description of the reliability and qualification issues related to the application of compound semiconductor devices in critical space systems. A discussion of common failure mechanisms, radiation effects and other reliability concerns is provided along with a discussion of methods for technology qualification for high reliability space applications.
    Keywords: Electronics and Electrical Engineering
    Type: Space-Based Observation Technology; 26-1 - 26-9; RTO-MP-61
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