ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The authors have developed a magnet-type tip transfer system for use in an ultrahigh vacuum scanning tunneling microscopy/field ion microscopy (UHV-STM/FIM) system. The construction of the tip transfer system ensures that a tip can be introduced into the STM and the FIM in situ without any chances of tip crushing during handling. The new tip transfer system is extremely simple and reliable, and is particularly suitable for rapid tip exchange in the STM. An atom-resolved image of a highly oriented pyrolytic graphite has been obtained with a tungsten tip characterized by an FIM and transferred to an STM via this transfer system.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141905
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