Publication Date:
2016-10-11
Description:
Author(s): Tiffany C. Kaspar, Peter V. Sushko, Mark E. Bowden, Steve M. Heald, Alexandra Papadogianni, Carsten Tschammer, Oliver Bierwagen, and Scott A. Chambers Epitaxial thin films of C r 2 − x T i x O 3 were deposited by oxygen-plasma-assisted molecular beam epitaxy for 0.04 ≤ x ≤ 0.26 . Ti valence is verified by both x-ray photoelectron spectroscopy (XPS) and Ti K -edge x-ray absorption near-edge spectroscopy (XANES) to be T i 4 + . Substitution of Ti for Cr in the corundu… [Phys. Rev. B 94, 155409] Published Fri Oct 07, 2016
Keywords:
Surface physics, nanoscale physics, low-dimensional systems
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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