ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Microhardness measurements have been performed on Tl x In1−x Se semiconductors (x=0.0, 0.2, 0.3 ... 1.0). The microhardness, H, as a function of x shows a maximum at x ca. 0.5. A statistical evaluation of the obtained results leads to a log-normal distribution of the microhardness rather than, as expected, a polynomial one.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00356689
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