ISSN:
1573-7357
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract Nb/Al/AlOx/Nb junctions have been shown to be effective x-ray detectors that are robust to thermal cycling. We compare results from two junctions, one with a fine-grained base-layer electrode and counterelectrode and the other with an epitaxial base-layer electrode and a fine-grained counterelectrode. For a 6 keV x-ray, at 0.4 K, the epitaxial sample had a FWHM resolution of 157 eV and the fine-grained junction had a FWHM resolution of 300 eV. The differences between the junctions will be discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00693479
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