ISSN:
1013-9826
Source:
Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Au/SiO2 nano-composite multilayer thin films with different thickness were prepared on aquartz substrate by magnetron plasma sputtering. The microstructure, morphology and optical propertiesof the films were investigated by using TEM and optical absorption spectra. [Au/SiO2]×5 and [Au/SiO2] ×11 multilayer thin films have well-defined interface. The thickness of the multilayer was 60nm and 130nm for the thin films with 5 and 11 layers, respectively. The optical absorption peaks due to the surfaceplasma resonance appeared at a wavelength of 560 nm for the both [Au/SiO2]×5 and [Au/SiO2]×11 thinfilms. The intensity of the absorption peak increased with increasing numbers of deposition layers. Theoptical absorption spectra of Au/SiO2 multilayer thin films are well agreement with the theoretical opticalabsorption spectra calculated from rewritten Maxwell–Garnett effective medium theory
Type of Medium:
Electronic Resource
URL:
http://www.tib-hannover.de/fulltexts/2011/0528/01/54/transtech_doi~10.4028%252Fwww.scientific.net%252FKEM.336-338.2575.pdf
Permalink