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  • 1
    Electronic Resource
    Electronic Resource
    Bognor Regis [u.a.] : Wiley-Blackwell
    Journal of Polymer Science Part B: Polymer Physics 34 (1996), S. 1809-1813 
    ISSN: 0887-6266
    Keywords: slow crack growth ; polyethylene ; critical molecular weight ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Chemistry and Pharmacology , Physics
    Notes: An ethylene-hexene copolymer was fractionated into five fractions and the density of short-chain branches was measured for each fraction. The slow crack growth behavior was measured on each fraction by sandwiching the small amount of fractionated resin of about 0.2 g between polyethylene grips. The resistance to slow crack growth was negligible for the three fractions whose Mw was less than 1.5 × 105. For the fourth fraction with Mw greater than 1.5 × 105, the resistance to slow crack growth was very high, being greater than that for the whole resin even though its density of short-chain branches was less than that of the whole resin. It is concluded that a molecular weight greater than 1.5 × 105 is required to create the number of tie molecules that is necessary to produce a high resistance to slow crack growth in this particular copolymer. © 1996 John Wiley & Sons, Inc.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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