ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
An instrument for polarization analysis in magnetic x-ray scattering is now being commissioned. Its side view is shown in Fig. 1, and inserts in the figure show the polarization state of x rays at various spots. This system adopts no flipping of the magnetic field over a hard magnetic material which needs large saturation magnetization. Its basic components are (a) a polarizer monochromator which converts the horizontal polarization into 45° one, (b) a two-axis diffractometer having a magnet for a sample, and (c) a polarization analyzer crystal. Furthermore, the magnet accommodates a cryostat for cooling a sample and a solid state detector covered with a magnetic shield cap for measuring fluorescent x rays. The electric vector of linearly polarized x rays is rotated through scattering from a magnetic sample because both magnetic scattering amplitudes, σ0 to σf and π0 to πf, are different from those of the electric one. It will be therefore possible to investigate the spin-resolved unoccupied density of states by analyzing polarization of the magnetically scattered x rays. Polarization analysis of a Gd metal at L edges is now under way.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143126
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