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  • 1
    Electronic Resource
    Electronic Resource
    Threading dislocations in silicon layer produced by separation by implanted oxygen process (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 80 (1996), S. 2113-2120 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Threading dislocations in the silicon layer in three different types of the silicon on insulator samples produced by standard and improved separation by implanted oxygen (SIMOX) processes were investigated by synchrotron x-ray topography, scanning electron microscopy (SEM), and optical microscopy. The densities and Burgers vectors of the dislocations were first determined nondestructively by synchrotron x-ray topography. Then the line directions of the same dislocations were determined by SEM after chemical Secco etching. Some of these results were compared with results obtained from optical microscopy of Secco etched samples. The threading dislocations in the Si layer were found to occur mainly in pairs with densities of the order of 105 cm−2 in standard SIMOX samples and of the order of 104 cm−2 in improved SIMOX samples. These dislocations have an edge character. Other features of these dislocations, such as the distances between two dislocations forming a pair, orientations of these pairs, and dislocations that change their line direction, are also discussed. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.363104
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  • 2
    Electronic Resource
    Electronic Resource
    X-ray Moiré Topography on SIMOX Structures (1996)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 29 (1996), S. 568-573 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889896006401
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  • 3
    Electronic Resource
    Electronic Resource
    Three-dimensional imaging of crystal defects by `topo-tomography' (2001)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 34 (2001), S. 602-607 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: A new technique, `topo-tomography', suitable for the characterization of the three-dimensional defect structure in bulk crystals, is proposed. The technique consists of the combination of diffraction topography and microtomography. It is applicable to high-quality single crystals, provided that the `direct image' is the dominant contrast mechanism. In this case, crystal defects give rise to locally enhanced intensity compared with the perfect-crystal matrix. The additional intensities sum along the diffracted-beam direction and yield projections of the local Bragg reflectivity. Like in the case of absorption tomography, the three-dimensional distribution of this reflectivity can be reconstructed from a large number of projections. The first experimental results of this technique, applied to a synthetic diamond crystal, are presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S002188980101086X
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  • 4
    Electronic Resource
    Electronic Resource
    Remeasurement of the profile of the characteristic Cu Kα emission line with high precision and accuracy (1993)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 539-548 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Single- and double-crystal spectrometer measurements of the Cu Kα doublet have been carried out after the selection of optimum measurement procedures and parameters. These include the influences of the X-ray-tube arrangement, horizontal and vertical divergences and the slow θ or λ dependence of the reflection curve. The influence of the apparatus function on the measured intensity distribution was minimized. The measured intensity profile could be approximated by a convolution of the instrumental function and the spectral line, with the inclusion of two additional terms. The intrinsic spectral line was fitted by Lorentz functions and, thus, described by 12 parameters. Good agreement between the results of the different measuring procedures and those of other authors is obtained. The apparent differences are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889893000160
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  • 5
    Electronic Resource
    Electronic Resource
    On the integrated reflectivity of perfect crystals in extremely asymmetric Bragg cases of X-ray diffraction (1981)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 37 (1981), S. 802-804 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: In the case of grazing incidence, the integrated reflectivity calculated according to the theory appropriate for extreme asymmetry is smaller than that calculated according to the conventional theory. In the case of grazing emergence the results calculated according to each theory exhibit smaller differences than for the first case within a great range of extreme asymmetry. In the conventional theory the integrated reflectivity tends to zero for α - θB tending to zero, whereas the theory for extremely asymmetric cases provides a non-zero value for the reflectivity for α- θB tending to zero.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0567739481001770
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  • 6
    Electronic Resource
    Electronic Resource
    Moiré Fringes and/or Translation-Fault Fringes? (1997)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 53 (1997), S. 199-201 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Interference fringes on transmission topographs of crystals with an implanted amorphous layer are, among others, attributed to the moiré or the translation-fault effect. This discussion is reconsidered in the frame of the theory of a perfect bicrystal extended to a deformed one. It is shown that translation-fault fringes have the same properties as moiré fringes and that it is not necessary to introduce translation-fault fringes as a new diffraction phenomenon.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767396013438
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  • 7
    Electronic Resource
    Electronic Resource
    Applications of dynamical diffraction under locally plane wave conditions: defects in nearly perfect crystals and X-ray refractometry (2001)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 57 (2001), S. 526-530 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: In a previous paper, the concept of a locally plane wave was explained theoretically. In such a configuration, the fringe pattern recorded on the film can be considered as a phase analyser. Here the experimental analysis is presented, showing examples of interesting applications to X-ray refractometry and to the visualization of the strain field around isolated defects.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767301006985
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  • 8
    Electronic Resource
    Electronic Resource
    Remeasurement of the profile of the characteristic Cu Kα emission line with high precision and accuracy. Erratum (1993)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 845-845 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Two errors in the paper by Härtwig, Hölzer, Wolf & Förster [J. Appl. Cryst. (1993), 26, 539–548] are corrected. On p. 540, the fifth line after equation (1) should read `δ1, δ2 and κ are small tilts of the crystals and the collimator, respectively'. In the reference list, the reference to Wilson (1958) should read Wilson, A. J. C. (1958). Proc. Phys. Soc. London, 72, 924–925.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889893010660
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  • 9
    Electronic Resource
    Electronic Resource
    Comments on absorption in Takagi–Taupin equations (1987)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 522-525 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The Takagi-Taupin theory of X-ray diffraction leaves an ambiguity in the choice of the wave vector inside the crystal. This holds also for its imaginary part which describes absorption. One consequence of this ambiguity is that the wave vector k0 inside the crystal need not always satisfy the continuity conditions for the tangential component of the wave vector at the entrance surface. But if the direction of the imaginary part is once fixed then it determines the particular manner of solution of the Takagi-Taupin equations. Thus a direction of the imaginary part of the wave vector in the crystal parallel to the reflecting net planes will in general ensure that the continuity condition is not satisfied; only a wave vector with an imaginary part perpendicular to the crystal surface can satisfy this condition.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767387099082
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  • 10
    Electronic Resource
    Electronic Resource
    X-ray diffraction moiré topography as a means to reconstruct relative displacement fields in weakly deformed bicrystals (1999)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 55 (1999), S. 423-432 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: X-ray diffraction topographs of wafers produced by separation by implanted oxygen (SIMOX) show moiré fringes in both reflection and transmission geometry. These fringes reveal deformations of the order of 10−6 to 10−8 between the layer and the substrate of the SIMOX material. A new method for a quantitative analysis of moiré fringes is developed and allows reconstruction with a high sensitivity of the three components of the relative displacement field between layer and substrate directly from a set of topographs. This method is used for the interpretation of moiré topographs of entire 4 in SIMOX wafers and of regions around crystal defects. Finally, the capabilities of an analysis of moiré fringes are compared with those of the usual diffraction topography.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767398010794
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